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Variability-aware parametric yield estimation for analog/mixed-signal circuits : concepts, algorithms and challenges

หน่วยงาน Nanyang Technological University, Singapore

รายละเอียด

ชื่อเรื่อง : Variability-aware parametric yield estimation for analog/mixed-signal circuits : concepts, algorithms and challenges
นักวิจัย : Gong, Fang , Shi, Yiyu , Yu, Hao , He, Lei
คำค้น : DRNTU::Engineering::Electrical and electronic engineering.
หน่วยงาน : Nanyang Technological University, Singapore
ผู้ร่วมงาน : -
ปีพิมพ์ : 2556
อ้างอิง : Gong, F., Shi, Y., Yu, H., & He, L. (2014). Variability-aware parametric yield estimation for analog/mixed-signal circuits : concepts, algorithms and challenges. IEEE Design & Test, 1-1. , 2168-2356 , http://hdl.handle.net/10220/19252 , http://dx.doi.org/10.1109/MDAT.2014.2299279
ที่มา : -
ความเชี่ยวชาญ : -
ความสัมพันธ์ : IEEE design & test
ขอบเขตของเนื้อหา : -
บทคัดย่อ/คำอธิบาย :

With technology scaling down to 90nm and below, process variation has become a primary challenge for both design and fabrication of analog/mixed-signal circuits due to significantly increased circuit failures and yield loss. As a result, it is urgently required to estimate the yield of one design efficiently in the presence of process variation. In this paper, we present the recent advance for yield estimation for analog/mixed-signal circuits with a number of critical topics and techniques discussed and classified into two categories. The first is performance domain method, which requires extensive Monte Carlo simulations; and the second is parameter domain method, which requires the characterization of yield boundary defined by performance constraints without using Monte Carlo. We review the pros and cons of these methods, which are evaluated by a number of circuit examples with quantitative comparison.

บรรณานุกรม :
Gong, Fang , Shi, Yiyu , Yu, Hao , He, Lei . (2556). Variability-aware parametric yield estimation for analog/mixed-signal circuits : concepts, algorithms and challenges.
    กรุงเทพมหานคร : Nanyang Technological University, Singapore.
Gong, Fang , Shi, Yiyu , Yu, Hao , He, Lei . 2556. "Variability-aware parametric yield estimation for analog/mixed-signal circuits : concepts, algorithms and challenges".
    กรุงเทพมหานคร : Nanyang Technological University, Singapore.
Gong, Fang , Shi, Yiyu , Yu, Hao , He, Lei . "Variability-aware parametric yield estimation for analog/mixed-signal circuits : concepts, algorithms and challenges."
    กรุงเทพมหานคร : Nanyang Technological University, Singapore, 2556. Print.
Gong, Fang , Shi, Yiyu , Yu, Hao , He, Lei . Variability-aware parametric yield estimation for analog/mixed-signal circuits : concepts, algorithms and challenges. กรุงเทพมหานคร : Nanyang Technological University, Singapore; 2556.