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Barrier height determination of Au/Oxidized GaAs/n-GaAs using ballistic electron emission spectroscopy

หน่วยงาน Nanyang Technological University, Singapore

รายละเอียด

ชื่อเรื่อง : Barrier height determination of Au/Oxidized GaAs/n-GaAs using ballistic electron emission spectroscopy
นักวิจัย : Qin, Hailang , Liu, Zhiqiang , Troadec, Cedric , Goh, Johnson Kuan Eng , Bosman, Michel , Ong, Beng Sheng , Chiam, Sing Yang , Pey, Kin Leong
คำค้น : -
หน่วยงาน : Nanyang Technological University, Singapore
ผู้ร่วมงาน : -
ปีพิมพ์ : 2555
อ้างอิง : Qin, H., Liu, Z., Troadec, C., Goh, J. K. E., Bosman, M., Ong, B. S., et al. (2012). Barrier height determination of Au/Oxidized GaAs/n-GaAs using ballistic electron emission spectroscopy. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 30(1), 011805-. , 2166-2746 , http://hdl.handle.net/10220/17845 , http://dx.doi.org/10.1116/1.3675606
ที่มา : -
ความเชี่ยวชาญ : -
ความสัมพันธ์ : Journal of vacuum science & technology B: microelectronics and nanometer structures
ขอบเขตของเนื้อหา : -
บทคัดย่อ/คำอธิบาย :

Ballisticelectron emission spectroscopy (BEES) was used to determine the electron barrier height at the interface of Au and an oxidizedGaAs film. Two thresholds were observed in the spectra. In a two-step procedure, we identified the first threshold at ∼1.4 eV, which we show arose from electron-hole pairs excited by photons emitted during scanning tunneling microscopy(STM), and the second threshold at ∼3.55 eV, which is attributed to the Au/oxidized-GaAs barrier. Our results demonstrate that the two-threshold behavior observed in BEES studies on metal/oxide samples is amenable to a physical model comprising of STMphotocurrent and a metal/oxide interface barrier.

บรรณานุกรม :
Qin, Hailang , Liu, Zhiqiang , Troadec, Cedric , Goh, Johnson Kuan Eng , Bosman, Michel , Ong, Beng Sheng , Chiam, Sing Yang , Pey, Kin Leong . (2555). Barrier height determination of Au/Oxidized GaAs/n-GaAs using ballistic electron emission spectroscopy.
    กรุงเทพมหานคร : Nanyang Technological University, Singapore.
Qin, Hailang , Liu, Zhiqiang , Troadec, Cedric , Goh, Johnson Kuan Eng , Bosman, Michel , Ong, Beng Sheng , Chiam, Sing Yang , Pey, Kin Leong . 2555. "Barrier height determination of Au/Oxidized GaAs/n-GaAs using ballistic electron emission spectroscopy".
    กรุงเทพมหานคร : Nanyang Technological University, Singapore.
Qin, Hailang , Liu, Zhiqiang , Troadec, Cedric , Goh, Johnson Kuan Eng , Bosman, Michel , Ong, Beng Sheng , Chiam, Sing Yang , Pey, Kin Leong . "Barrier height determination of Au/Oxidized GaAs/n-GaAs using ballistic electron emission spectroscopy."
    กรุงเทพมหานคร : Nanyang Technological University, Singapore, 2555. Print.
Qin, Hailang , Liu, Zhiqiang , Troadec, Cedric , Goh, Johnson Kuan Eng , Bosman, Michel , Ong, Beng Sheng , Chiam, Sing Yang , Pey, Kin Leong . Barrier height determination of Au/Oxidized GaAs/n-GaAs using ballistic electron emission spectroscopy. กรุงเทพมหานคร : Nanyang Technological University, Singapore; 2555.