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Resistive switching behavior of partially anodized aluminum thin film at elevated temperatures

หน่วยงาน Nanyang Technological University, Singapore

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ชื่อเรื่อง : Resistive switching behavior of partially anodized aluminum thin film at elevated temperatures
นักวิจัย : Zhu, Wei , Chen, Tupei , Yang, Ming , Liu, Yang , Fung, Stevenson Hon Yuen
คำค้น : DRNTU::Engineering::Electrical and electronic engineering.
หน่วยงาน : Nanyang Technological University, Singapore
ผู้ร่วมงาน : -
ปีพิมพ์ : 2555
อ้างอิง : Zhu, W., Chen, T., Yang, M., Liu, Y., & Fung, S. H. Y. (2012). Resistive switching behavior of partially anodized aluminum thin film at elevated temperatures. IEEE transactions on electron devices, 59(9), 2363-2367. , 0018-9383 , http://hdl.handle.net/10220/13478 , http://dx.doi.org/10.1109/TED.2012.2205692
ที่มา : -
ความเชี่ยวชาญ : -
ความสัมพันธ์ : IEEE transactions on electron devices
ขอบเขตของเนื้อหา : -
บทคัดย่อ/คำอธิบาย :

Resistive switching behavior of partially anodized aluminum thin film has been investigated at temperatures of 25 °C–250 °C. Both the reset and set voltages decrease with increasing temperature, showing Arrhenius-like dependence with small activation energies. The pulse voltage experiment also suggests that the conductive filament breaking/reconnection is easier to occur at a higher temperature. Some possible mechanisms for the phenomena are discussed. On the other hand, at elevated temperatures without continuous electric field applied, while the high-resistance state exhibits no significant change with time, the low-resistance state (LRS) shows a continuous degradation, and there is a sudden failure. The LRS failure time shows Arrhenius dependence with an activation energy of ~1.3 eV, suggesting that the LRS failure could be due to the migration of the excess Al atoms at high temperatures.

บรรณานุกรม :
Zhu, Wei , Chen, Tupei , Yang, Ming , Liu, Yang , Fung, Stevenson Hon Yuen . (2555). Resistive switching behavior of partially anodized aluminum thin film at elevated temperatures.
    กรุงเทพมหานคร : Nanyang Technological University, Singapore.
Zhu, Wei , Chen, Tupei , Yang, Ming , Liu, Yang , Fung, Stevenson Hon Yuen . 2555. "Resistive switching behavior of partially anodized aluminum thin film at elevated temperatures".
    กรุงเทพมหานคร : Nanyang Technological University, Singapore.
Zhu, Wei , Chen, Tupei , Yang, Ming , Liu, Yang , Fung, Stevenson Hon Yuen . "Resistive switching behavior of partially anodized aluminum thin film at elevated temperatures."
    กรุงเทพมหานคร : Nanyang Technological University, Singapore, 2555. Print.
Zhu, Wei , Chen, Tupei , Yang, Ming , Liu, Yang , Fung, Stevenson Hon Yuen . Resistive switching behavior of partially anodized aluminum thin film at elevated temperatures. กรุงเทพมหานคร : Nanyang Technological University, Singapore; 2555.