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Effect of IC layout on the reliability of CMOS amplifiers

หน่วยงาน Nanyang Technological University, Singapore

รายละเอียด

ชื่อเรื่อง : Effect of IC layout on the reliability of CMOS amplifiers
นักวิจัย : He, Feifei , Tan, Cher Ming
คำค้น : DRNTU::Engineering::Electrical and electronic engineering.
หน่วยงาน : Nanyang Technological University, Singapore
ผู้ร่วมงาน : -
ปีพิมพ์ : 2554
อ้างอิง : http://hdl.handle.net/10220/11171 , http://dx.doi.org/10.1016/j.microrel.2011.11.010
ที่มา : -
ความเชี่ยวชาญ : -
ความสัมพันธ์ : Microelectronics reliability
ขอบเขตของเนื้อหา : -
บทคัดย่อ/คำอธิบาย :

With shrinking device size and increasing circuit complexity, interconnect reliability has become the main factor that affects the integrated circuit (IC) reliability. Electromigration (EM) is the major failure mechanism for interconnect reliability. However, little research had been done on the effect of IC layout on the void nucleation time (i.e. the time where the vacancies in the metal gather and nucleate into a tiny void) in the interconnections of the circuits due to electromigration using 3D modeling. In this paper, we construct the 3D models for a CMOS class-AB amplifier and a RF low noise amplifier (LNA), and investigate the impact of layout design on the void nucleation time through the computation of the atomic flux divergence (AFD) of the 3D circuit models. From the simulation results we find that, there is a change in the value of the maximum total AFD with the change in the number of contacts or the inter-transistor distance. A change in the location of the maximum total AFD is observed in the LNA circuit with different finger number as a result of the change in the line width and the transistor rotation. This indicates a different reliability lifetime and void formation location with different layout designs.

บรรณานุกรม :
He, Feifei , Tan, Cher Ming . (2554). Effect of IC layout on the reliability of CMOS amplifiers.
    กรุงเทพมหานคร : Nanyang Technological University, Singapore.
He, Feifei , Tan, Cher Ming . 2554. "Effect of IC layout on the reliability of CMOS amplifiers".
    กรุงเทพมหานคร : Nanyang Technological University, Singapore.
He, Feifei , Tan, Cher Ming . "Effect of IC layout on the reliability of CMOS amplifiers."
    กรุงเทพมหานคร : Nanyang Technological University, Singapore, 2554. Print.
He, Feifei , Tan, Cher Ming . Effect of IC layout on the reliability of CMOS amplifiers. กรุงเทพมหานคร : Nanyang Technological University, Singapore; 2554.