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Ensuring accuracy in optical and electrical measurement of ultra-bright LEDs during reliability test

หน่วยงาน Nanyang Technological University, Singapore

รายละเอียด

ชื่อเรื่อง : Ensuring accuracy in optical and electrical measurement of ultra-bright LEDs during reliability test
นักวิจัย : Chen, Sihan Joseph , Tan, Cher Ming , Chen, Eric Boon Khai , Chua, Shaun Zhi Yong
คำค้น : DRNTU::Engineering::Electrical and electronic engineering::Microelectronics.
หน่วยงาน : Nanyang Technological University, Singapore
ผู้ร่วมงาน : -
ปีพิมพ์ : 2554
อ้างอิง : http://hdl.handle.net/10220/11227 , http://dx.doi.org/10.1016/j.microrel.2011.08.020
ที่มา : -
ความเชี่ยวชาญ : -
ความสัมพันธ์ : Microelectronics reliability
ขอบเขตของเนื้อหา : -
บทคัดย่อ/คำอธิบาย :

In order to accurately estimate the lifetime of Light Emitting Diodes (LEDs), accelerated stress tests have to be performed, and measurements done throughout the tests should be free of artifact and repeatable to ensure accurate observations of the degradation of the LEDs. In this work, measurements artifact arising from DC biasing and PWM settings were first presented. Electrical measurements consistency was then studied. Optimized setting for accurate measurement is obtained using Response Surface Method with Central Composite Design, and the setting is verified through experiments.

บรรณานุกรม :
Chen, Sihan Joseph , Tan, Cher Ming , Chen, Eric Boon Khai , Chua, Shaun Zhi Yong . (2554). Ensuring accuracy in optical and electrical measurement of ultra-bright LEDs during reliability test.
    กรุงเทพมหานคร : Nanyang Technological University, Singapore.
Chen, Sihan Joseph , Tan, Cher Ming , Chen, Eric Boon Khai , Chua, Shaun Zhi Yong . 2554. "Ensuring accuracy in optical and electrical measurement of ultra-bright LEDs during reliability test".
    กรุงเทพมหานคร : Nanyang Technological University, Singapore.
Chen, Sihan Joseph , Tan, Cher Ming , Chen, Eric Boon Khai , Chua, Shaun Zhi Yong . "Ensuring accuracy in optical and electrical measurement of ultra-bright LEDs during reliability test."
    กรุงเทพมหานคร : Nanyang Technological University, Singapore, 2554. Print.
Chen, Sihan Joseph , Tan, Cher Ming , Chen, Eric Boon Khai , Chua, Shaun Zhi Yong . Ensuring accuracy in optical and electrical measurement of ultra-bright LEDs during reliability test. กรุงเทพมหานคร : Nanyang Technological University, Singapore; 2554.