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Thickness identification of two-dimensional materials by optical imaging

หน่วยงาน Nanyang Technological University, Singapore

รายละเอียด

ชื่อเรื่อง : Thickness identification of two-dimensional materials by optical imaging
นักวิจัย : Wang, Yingying , Gao, Ren Xi , Ni, Zhen Hua , He, Hui , Guo, Shu Peng , Yang, Huanping , Cong, Chunxiao , Yu, Ting
คำค้น : -
หน่วยงาน : Nanyang Technological University, Singapore
ผู้ร่วมงาน : -
ปีพิมพ์ : 2555
อ้างอิง : Wang, Y. Y., Gao, R. X., Ni, Z. H., He, H., Guo, S. P., Yang, H. P., et al. (2012). Thickness identification of two-dimensional materials by optical imaging. Nanotechnology, 23(49). , 0957-4484 , http://hdl.handle.net/10220/10678 , http://dx.doi.org/10.1088/0957-4484/23/49/495713
ที่มา : -
ความเชี่ยวชาญ : -
ความสัมพันธ์ : Nanotechnology
ขอบเขตของเนื้อหา : -
บทคัดย่อ/คำอธิบาย :

Two-dimensional materials, e.g. graphene and molybdenum disulfide (MoS2), have attracted great interest in recent years. Identification of the thickness of two-dimensional materials will improve our understanding of their thickness-dependent properties, and also help with scientific research and applications. In this paper, we propose to use optical imaging as a simple, quantitative and universal way to identify the thickness of two-dimensional materials, i.e. mechanically exfoliated graphene, nitrogen-doped chemical vapor deposition grown graphene, graphene oxide and mechanically exfoliated MoS2. The contrast value can easily be obtained by reading the red (R), green (G) and blue (B) values at each pixel of the optical images of the sample and substrate, and this value increases linearly with sample thickness, in agreement with our calculation based on the Fresnel equation. This method is fast, easily performed and no expensive equipment is needed, which will be an important factor for large-scale sample production. The identification of the thickness of two-dimensional materials will greatly help in fundamental research and future applications.

บรรณานุกรม :
Wang, Yingying , Gao, Ren Xi , Ni, Zhen Hua , He, Hui , Guo, Shu Peng , Yang, Huanping , Cong, Chunxiao , Yu, Ting . (2555). Thickness identification of two-dimensional materials by optical imaging.
    กรุงเทพมหานคร : Nanyang Technological University, Singapore.
Wang, Yingying , Gao, Ren Xi , Ni, Zhen Hua , He, Hui , Guo, Shu Peng , Yang, Huanping , Cong, Chunxiao , Yu, Ting . 2555. "Thickness identification of two-dimensional materials by optical imaging".
    กรุงเทพมหานคร : Nanyang Technological University, Singapore.
Wang, Yingying , Gao, Ren Xi , Ni, Zhen Hua , He, Hui , Guo, Shu Peng , Yang, Huanping , Cong, Chunxiao , Yu, Ting . "Thickness identification of two-dimensional materials by optical imaging."
    กรุงเทพมหานคร : Nanyang Technological University, Singapore, 2555. Print.
Wang, Yingying , Gao, Ren Xi , Ni, Zhen Hua , He, Hui , Guo, Shu Peng , Yang, Huanping , Cong, Chunxiao , Yu, Ting . Thickness identification of two-dimensional materials by optical imaging. กรุงเทพมหานคร : Nanyang Technological University, Singapore; 2555.