ridm@nrct.go.th   ระบบคลังข้อมูลงานวิจัยไทย   รายการโปรดที่คุณเลือกไว้

Comparative study of current-voltage characteristics of Ni and Ni(Pt)- alloy silicided p+/n diodes

หน่วยงาน Nanyang Technological University, Singapore

รายละเอียด

ชื่อเรื่อง : Comparative study of current-voltage characteristics of Ni and Ni(Pt)- alloy silicided p+/n diodes
นักวิจัย : Chi, Dong Zhi , Mangelinck, D. , Lahiri, S. K. , Lee, Pooi See , Pey, Kin Leong
คำค้น : DRNTU::Engineering::Materials::Microelectronics and semiconductor materials
หน่วยงาน : Nanyang Technological University, Singapore
ผู้ร่วมงาน : -
ปีพิมพ์ : 2544
อ้างอิง : Chi, D. Z., Mangelick, D., Lahiri, S. K., Lee, P. S., & Pey, K. L. (2001). Comparative study of current-voltage characteristics of Ni and Ni(Pt)- alloy silicided p+/n diodes. Applied Physics Letters, 78(21), 3256-3258. , http://hdl.handle.net/10220/8105 , http://dx.doi.org/10.1063/1.1374496
ที่มา : -
ความเชี่ยวชาญ : -
ความสัมพันธ์ : Applied physics letters
ขอบเขตของเนื้อหา : -
บทคัดย่อ/คำอธิบาย :

A comparative study of the I –V characteristics of p+/n diodes silicided with a pure Ni and Ni(Pt) alloy has been performed. Higher saturation currents as well as abnormal reverse I –V characteristics were observed for some of the diodes which were silicided with pure Ni at 700 °C while good I –V characteristics were observed for other diodes. Our results show that the forward current in the diodes with good I –V characteristics is dominated by electron diffusion in the p+ region. For diodes with higher saturation currents, it has been concluded that both forward and reverse currents in these diodes are dominated by the current following through Schottky contacts that are formed due to inadvertent penetration of NiSi spikes through the p1 region into n region. The formation of Schottky contact was not observed in diodes silicided with a Ni(Pt) alloy, providing a clear evidence of enhanced thermal stability of Pt containing NiSi.

บรรณานุกรม :
Chi, Dong Zhi , Mangelinck, D. , Lahiri, S. K. , Lee, Pooi See , Pey, Kin Leong . (2544). Comparative study of current-voltage characteristics of Ni and Ni(Pt)- alloy silicided p+/n diodes.
    กรุงเทพมหานคร : Nanyang Technological University, Singapore.
Chi, Dong Zhi , Mangelinck, D. , Lahiri, S. K. , Lee, Pooi See , Pey, Kin Leong . 2544. "Comparative study of current-voltage characteristics of Ni and Ni(Pt)- alloy silicided p+/n diodes".
    กรุงเทพมหานคร : Nanyang Technological University, Singapore.
Chi, Dong Zhi , Mangelinck, D. , Lahiri, S. K. , Lee, Pooi See , Pey, Kin Leong . "Comparative study of current-voltage characteristics of Ni and Ni(Pt)- alloy silicided p+/n diodes."
    กรุงเทพมหานคร : Nanyang Technological University, Singapore, 2544. Print.
Chi, Dong Zhi , Mangelinck, D. , Lahiri, S. K. , Lee, Pooi See , Pey, Kin Leong . Comparative study of current-voltage characteristics of Ni and Ni(Pt)- alloy silicided p+/n diodes. กรุงเทพมหานคร : Nanyang Technological University, Singapore; 2544.