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Analytical high frequency channel thermal noise modeling in deep sub-micron MOSFETs

หน่วยงาน Nanyang Technological University, Singapore

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ชื่อเรื่อง : Analytical high frequency channel thermal noise modeling in deep sub-micron MOSFETs
นักวิจัย : Ong, Shih Ni , Yeo, Kiat Seng , Chew, Kok Wai Johnny , Chan, Lye Hock , Loo, Xi Sung , Do, Manh Anh , Boon, Chirn Chye
คำค้น : DRNTU::Engineering::Electrical and electronic engineering::Semiconductors.
หน่วยงาน : Nanyang Technological University, Singapore
ผู้ร่วมงาน : -
ปีพิมพ์ : 2552
อ้างอิง : Ong, S. N., Yeo, K. S., Chew K. W. J., Chan, L. H. K., Loo, X. S., Do, M. A., et al. (2009). Analytical high frequency channel thermal noise modeling in deep sub-micron MOSFETs. Proceedings of the 12th International Symposium on Integrated Circuits, (pp.306-309) Singapore. , http://hdl.handle.net/10220/6354 , http://ieeexplore.ieee.org/search/freesrchabstract.jsp?tp=&arnumber=5403708&queryText%3DAnalytical+High+Frequency+Channel+Thermal+Noise+Modeling+in+Deep+Sub-micron+MOSFETs%26openedRefinements%3D*%26searchField%3DSearch+All , http://www.isic2009.org/
ที่มา : -
ความเชี่ยวชาญ : -
ความสัมพันธ์ : -
ขอบเขตของเนื้อหา : -
บทคัดย่อ/คำอธิบาย :

A simple high frequency channel thermal noise model was developed for MOSFETs in strong inversion region. Short channel effects such as channel length modulation effect and mobility degradation due to vertical field were taken into account in the current-voltage model and channel thermal noise model. It was found that the long channel Tsividis’ noise model is still valid for short channel devices by including the proposed effective mobility model and the channel length modulation effect. Good agreement has been obtained between the simulated and measured results across different frequencies, gate biases and drain biases.

บรรณานุกรม :
Ong, Shih Ni , Yeo, Kiat Seng , Chew, Kok Wai Johnny , Chan, Lye Hock , Loo, Xi Sung , Do, Manh Anh , Boon, Chirn Chye . (2552). Analytical high frequency channel thermal noise modeling in deep sub-micron MOSFETs.
    กรุงเทพมหานคร : Nanyang Technological University, Singapore.
Ong, Shih Ni , Yeo, Kiat Seng , Chew, Kok Wai Johnny , Chan, Lye Hock , Loo, Xi Sung , Do, Manh Anh , Boon, Chirn Chye . 2552. "Analytical high frequency channel thermal noise modeling in deep sub-micron MOSFETs".
    กรุงเทพมหานคร : Nanyang Technological University, Singapore.
Ong, Shih Ni , Yeo, Kiat Seng , Chew, Kok Wai Johnny , Chan, Lye Hock , Loo, Xi Sung , Do, Manh Anh , Boon, Chirn Chye . "Analytical high frequency channel thermal noise modeling in deep sub-micron MOSFETs."
    กรุงเทพมหานคร : Nanyang Technological University, Singapore, 2552. Print.
Ong, Shih Ni , Yeo, Kiat Seng , Chew, Kok Wai Johnny , Chan, Lye Hock , Loo, Xi Sung , Do, Manh Anh , Boon, Chirn Chye . Analytical high frequency channel thermal noise modeling in deep sub-micron MOSFETs. กรุงเทพมหานคร : Nanyang Technological University, Singapore; 2552.