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Application of Wigner–Ville distribution in electromigration noise analysis

หน่วยงาน Nanyang Technological University, Singapore

รายละเอียด

ชื่อเรื่อง : Application of Wigner–Ville distribution in electromigration noise analysis
นักวิจัย : Tan, Cher Ming , Lim, Shin Yeh
คำค้น : DRNTU::Engineering::Electrical and electronic engineering.
หน่วยงาน : Nanyang Technological University, Singapore
ผู้ร่วมงาน : -
ปีพิมพ์ : 2545
อ้างอิง : Tan, C. M., & Lim, S. Y. (2002). Application of Wigner-Ville distribution in electromigration noise analysis. IEEE Transactions on Device and Materials Reliability, 2(2), 30-35. , 1530-4388 , http://hdl.handle.net/10220/4655 , http://dx.doi.org/10.1109/TDMR.2002.802114
ที่มา : -
ความเชี่ยวชาญ : -
ความสัมพันธ์ : IEEE transactions on device and materials reliability
ขอบเขตของเนื้อหา : -
บทคัดย่อ/คำอธิบาย :

Electromigration noise analysis has shown great potential for the nondestructive evaluation of electromigration performance of metal stripe. However, contradictive conclusions have been published from the electromigration noise analysis. These contradictive conclusions mainly stem from the complex dynamics of the atomic movement during electromigration, rendering the electromigration noise as a nonstationary signal, and, hence, the standard Fourier transform is not adequate. Among the various nonstationary signal analysis tools,Wigner–Ville distribution is used for the analysis of electromigration noise data for the first time. It is found that much “hidden” and useful information in the noise data can be revealed by using this distribution. These information will enable us to “see” the dynamic of the atomic movement during electromigration, enhancing our understanding of electromigration processes.

บรรณานุกรม :
Tan, Cher Ming , Lim, Shin Yeh . (2545). Application of Wigner–Ville distribution in electromigration noise analysis.
    กรุงเทพมหานคร : Nanyang Technological University, Singapore.
Tan, Cher Ming , Lim, Shin Yeh . 2545. "Application of Wigner–Ville distribution in electromigration noise analysis".
    กรุงเทพมหานคร : Nanyang Technological University, Singapore.
Tan, Cher Ming , Lim, Shin Yeh . "Application of Wigner–Ville distribution in electromigration noise analysis."
    กรุงเทพมหานคร : Nanyang Technological University, Singapore, 2545. Print.
Tan, Cher Ming , Lim, Shin Yeh . Application of Wigner–Ville distribution in electromigration noise analysis. กรุงเทพมหานคร : Nanyang Technological University, Singapore; 2545.