ridm@nrct.go.th   ระบบคลังข้อมูลงานวิจัยไทย   รายการโปรดที่คุณเลือกไว้

Pey, Kin Leong
หน่วยงาน Nanyang Technological University, Singapore
จำนวนงานวิจัยจำแนกรายปี
บุคคลที่เคยร่วมงานวิจัย
ความเชี่ยวชาญ
บุคคลที่เคยร่วมงานวิจัย
# นักวิจัย ร่วมงาน
1 Lee, Pooi See 36
2 Mangelinck, D. 14
3 Chi, Dong Zhi 14
4 Bosman, Michel 12
5 Ding, Jun 10
6 Wang, X. C. 9
7 Tan, Eu Jin 8
8 Raghavan, Nagarajan 7
9 Setiawan, Y. 7
10 Lim, G. C. 6
11 Gan, Chee Lip 5
12 See, A. 5
13 Tang, L. J. 5
14 Dai, J. Y. 5
15 Made, Riko I. 4
16 Wu, X. 4
17 Chow, F. L. 4
18 Thompson, Carl V. 3
19 Goh, K. E. J. 3
20 Wu, Xing 3
21 Chong, Y. F. 3
22 Singh, Navab 3
23 Wee, A. T. S. 3
24 Chin, Yoke King 3
25 Hoe, Keat Mun 3
26 Chia, Hong Ling 2
27 Kor, Katherine Hwee Boon 2
28 Choi, W. K. 2
29 Mahapatra, S. 2
30 Yan, Li Ling 2
31 Troadec, C. 2
32 Zhao, H. B. 2
33 Li, Xiang 2
34 Tan, Chuan Seng 2
35 Qin, H. L. 2
36 Antoniadis, D. A. 2
37 Goh, Johnson Kuan Eng 2
38 Balakumar, S. 2
39 Qin, Hailang 2
40 Chattopadhyay, Sujay 2
41 Shubhakar, K. 2
42 Cui, Guangda 2
43 Troadec, Cedric 2
44 Zhang, Qing 2
45 Wang, Xinghui 2
46 Susantyoko, Rahmat Agung 2
47 Ong, K. K. 2
48 Jaiswal, M. 1
49 Gan, C. L. 1
50 Zhang, Q. 1
51 Chandrasekhar, Natarajan 1
52 Liu, Q. 1
53 Vijila, C. 1
54 Kajen, R. S. 1
55 Heryanto, A. 1
56 Wei, J. 1
57 Trigg, Alastair David 1
58 Saravanan, S. 1
59 Putra, W. N. 1
60 Kwon, W. S. 1
61 Gao, S. 1
62 Che, Faxing 1
63 Toledo, N. G. 1
64 Leong, Kam Chew 1
65 Chen, Y. N. 1
66 Wang, Xinpeng 1
67 Chen, Zhixian 1
68 Ang, X. F. 1
69 Navab, Singh 1
70 Ho, C. S. 1
71 Yeo, K. L. 1
72 Wang, W. D. 1
73 Wong, C. P. 1
74 Kon, M. L. 1
75 Zhang, Y. W. 1
76 Osipowitcz, T. 1
77 Ng, Andrew M. H. 1
78 Ong, Beng Sheng 1
79 Borisenko, Victor E. 1
80 Zhang, Xi Xiang 1
81 Shubhakar, Kalya 1
82 Kushvaha, Sunil Singh 1
83 Kouda, Miyuki 1
84 O'Shea, Sean Joseph 1
85 Li, Kun 1
86 Liu, Zhiqiang 1
87 Thamankar, R. 1
88 Wang, Z. R. 1
89 Loke, Y. C. 1
90 O'Shea, S. J. 1
91 Chiam, Sing Yang 1
92 Kakushima, Kuniyuki 1
93 Iwai, Hiroshi 1
94 Bouville, Mathieu 1
95 Ng, Wee Loon 1
96 Tee, Kheng Chok 1
97 Srolovitz, David J. 1
98 Aubel, Oliver 1
99 Ee, Yong Chiang 1
100 Xiao, Qizhen 1
101 Fan, Yu 1
102 Larcher, Luca 1
103 Padovani, Andrea 1
104 Ho, C. K. F. 1
105 Tan, B. L. 1
106 Sun, Leimeng 1
107 Leong, H. L. 1
ปี
# พ.ศ. จำนวน
1 2557 5
2 2556 2
3 2555 14
4 2554 1
5 2552 2
6 2551 4
7 2550 3
8 2549 6
9 2548 3
10 2547 5
11 2546 2
12 2545 6
13 2544 3
14 2543 3
ผลงานวิจัย
# หัวเรื่อง
ปี พ.ศ. 2557
1 Leakage current and structural analysis of annealed HfO2/La2O3 and CeO2/La2O3 dielectric stacks : a nanoscopic study
2 Analysis of correlated gate and drain random telegraph noise in post-soft breakdownTiN/HfLaO/SiOx nMOSFETs
3 Germanium coated vertically-aligned multiwall carbon nanotubes as lithium-ion battery anodes
4 Stable cyclic performance of nickel oxide–carbon composite anode for lithium-ion batteries
5 Robust electromigration reliability through engineering optimization
ปี พ.ศ. 2556
6 Charge transport in lightly reduced graphene oxide : a transport energy perspective
7 Intrinsic nanofilamentation in resistive switching
ปี พ.ศ. 2555
8 Experimental characterization and modeling of the mechanical properties of Cu–Cu thermocompression bonds for three-dimensional integrated circuits
9 Effect of copper TSV annealing on via protrusion for TSV wafer fabrication
10 Study of charge distribution and charge loss in dual-layer metal-nanocrystal-embedded high-κ/SiO2 gate stack
11 The electronic barrier height of silicon native oxides at different oxidation stages
12 Subthreshold characteristics of ballistic electron emission spectra
13 Triggering voltage for post-breakdown random telegraph noise in HfLaO dielectric metal gate metal-oxide-semiconductor field effect transistors and its reliability implications
14 Temperature-dependent relaxation current on single and dual layer Pt metal nanocrystal-based Al2O3/SiO2 gate stack
15 Percolative model and thermodynamic analysis of oxygen-ion-mediated resistive switching
16 Vertical silicon nanowire diode with nickel silicide induced dopant segregation
17 Nanoscale physical analysis of localized breakdown events in HfO2/SiOX dielectric stacks : a correlation study of STM induced BD with C-AFM and TEM
18 Dielectric breakdown - recovery in logic and resistive switching in memory : bridging the gap between the two phenomena
19 Role of grain boundary percolative defects and localized trap generation on the reliability statistics of high-κ gate dielectric stacks
20 Effect of surface contamination on electron tunneling in the high bias range
21 Barrier height determination of Au/Oxidized GaAs/n-GaAs using ballistic electron emission spectroscopy
ปี พ.ศ. 2554
22 Experimental characterization and modeling of the mechanical properties of Cu–Cu thermocompression bonds for three-dimensional integrated circuits
ปี พ.ศ. 2552
23 Textured Ni(Pt) germanosilicide formation on a condensed Si1-xGex/Si substrate
24 Experimental characterization and modeling of the contact resistance of Cu-Cu bonded interconnects
ปี พ.ศ. 2551
25 Demonstration of Schottky barrier NMOS transistors with erbium silicided source/drain and silicon nanowire channel
26 Laser-induced melt-mediated Ni(Pt) germanosilicide formation on condensed Si1-xGex/Si substrates
27 Nickel-silicided Schottky junction CMOS transistors with gate-all-around nanowire channels
28 Erbium silicided schottky source/drain silicon nanowire N-metal–oxide–semiconductor field-effect transistors
ปี พ.ศ. 2550
29 Materials and electrical characterization of Er(Si1-xGex)(2-y) films formed on Si1-xGex(001) (x=0-0.3) via rapid thermal annealing
30 Laser-induced Ni(Pt) germanosilicide formation through a self-limiting melting phenomenon on Si1-xGex/Si heterostructure
31 Nickel silicide formation using multiple-pulsed laser annealing
ปี พ.ศ. 2549
32 Role of low temperature rapid thermal annealing in post-laser-annealed p-channel metal-oxide-semiconductor field effect transistor
33 Laser induced Ni(Ti) silicide formation
34 Improved electrical performance of Erbium silicide Schottky diodes formed by pre-RTA amorphization of Si
35 Pulsed laser induced silicidation on TiN-capped Co/Si bilayers
36 Multiple-pulse laser thermal annealing for the formation of Co-silicided junction
37 Pyramidal structural defects in erbium silicide thin films
ปี พ.ศ. 2548
38 On the morphological changes of Ni- and Ni(Pt)-silicides
39 Effects of Si(001) surface amorphization on ErSi2 thin film
40 Effect of Ti alloying in nickel silicide formation
ปี พ.ศ. 2547
41 Silicide formation from laser thermal processing of Ti/Co bilayers
42 Effects of Ti/Co and Co/Ti systems on the germanosilicidation of poly-Si capped poly-Si1−xGex substrate
43 Characterization of the junction leakage of Ti-capped Ni-silicided junctions
44 Ni(Pt) alloy silicidation on (100) Si and poly-silicon lines
45 Formation of ultra-shallow p+/n junctions in silicon-on-insulator (SOI) substrate using laser annealing
ปี พ.ศ. 2546
46 In situ XRD analysis of Ni(Pt)/Si(100) reactions in low temperature regime ≤400°C
47 Analysis of laterally non-uniform layers and sub-micron devices by Rutherford backscattering spectrometry
ปี พ.ศ. 2545
48 Interfacial reacions of Ni on Si1-xGex (x=0.2, 0.3) at low temperature by rapid thermal annealing
49 Effect of ion implantation on layer inversion of Ni silicided poly-Si
50 Phase and layer stability of Ni- and Ni(Pt)-silicides on narrow poly-Si lines
51 Layer inversion of Ni(Pt)Si on mixed phase Si films
52 Thermal reaction of nickel and Si0.75Ge0.25 alloy
53 Enhanced stability of Ni monosilicide on MOSFETs poly-Si gate stack
ปี พ.ศ. 2544
54 New salicidation technology with Ni(Pt) alloy for MOSFETs
55 Comparative study of current-voltage characteristics of Ni and Ni(Pt)- alloy silicided p+/n diodes
56 Nickel silicide formation on Si(100) and Poly-Si with a presilicide N2 + implantation
ปี พ.ศ. 2543
57 Improved NiSi salicide process using presilicide N2+ implant for MOSFETs
58 Micro-Raman spectroscopy investigation of nickel silicides and nickel (platinum) silicides
59 On the Ni–Si phase transformation with/without native oxide